Machine Learning for High-Risk Applications: Approaches to Responsible AI (Record no. 98174)
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000 -LEADER | |
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fixed length control field | 02020 a2200205 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 231222b |||||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9789355429728 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 005.74015 |
Cutter | HAL |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Hall Patrick |
245 ## - TITLE STATEMENT | |
Title | Machine Learning for High-Risk Applications: Approaches to Responsible AI |
250 ## - EDITION STATEMENT | |
Edition statement | 1st |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Name of publisher, distributor, etc | Shroff/O'Reilly |
Date of publication, distribution, etc | 2023 |
Place of publication, distribution, etc | India |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 464 |
520 ## - Remark | |
Summary, etc | The past decade has witnessed the broad adoption of artificial intelligence and machine learning (AI/ML) technologies. However, a lack of oversight in their widespread implementation has resulted in some incidents and harmful outcomes that could have been avoided with proper risk management. Before we can realize AI/ML's true benefit, practitioners must understand how to mitigate its risks.<br/><br/>This book describes approaches to responsible AI—a holistic framework for improving AI/ML technology, business processes, and cultural competencies that builds on best practices in risk management, cybersecurity, data privacy, and applied social science. Authors Patrick Hall, James Curtis, and Parul Pandey created this guide for data scientists who want to improve real-world AI/ML system outcomes for organizations, consumers, and the public.<br/><br/>Learn technical approaches for responsible AI across explainability, model validation and debugging, bias management, data privacy, and ML security<br/>Learn how to create a successful and impactful AI risk management practice<br/>Get a basic guide to existing standards, laws, and assessments for adopting AI technologies, including the new NIST AI Risk Management Framework<br/>Engage with interactive resources on GitHub and Colab<br/><br/>Source: https://www.amazon.in/Machine-Learning-High-Risk-Applications-Responsible/dp/935542972X/ref=sr_1_1?crid=SRP4D2OO6XAE&keywords=9789355429728&qid=1703250702&sprefix=9789355424150%2Caps%2C796&sr=8-1 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Machine Learning |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Curtis James |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Pandey Parul |
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
a | Business Analytics |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Item type | Book |
Source of classification or shelving scheme | Dewey Decimal Classification |
Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Collection code | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Cost, normal purchase price | Collection Type | Full call number | Barcode | Date last seen | Cost, replacement price | Koha item type |
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Dewey Decimal Classification | Reference book | Main Library | Main Library | Analytics | 06/12/2023 | Shroff Publisher | 1440.00 | Indian Book | 005.74015 HAL | 119107 | 06/12/2023 | 1800.00 | Book |